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 Microfocus X-ray Fluorescence Spectrometer - microfocus RFA analyzer "Focus-2"
Microfocus X-ray Fluorescence Spectrometer "FOCUS-2" On The Base Of Kumakhov Polycapillary Optics
Microfocus X-ray Fluorescence Spectrometer Analyzer "Focus-2" on the basis of Kumakhov polycapillary optics is designed for express RFA analysis of the composition and concentration of chemical elements in solids, loose materials, powders, liquids, samples precipitated on films and filter paper.
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Microfocus X-ray Fluorescence Analyzer Spectrometer "Focus-2" comprises:
- 3D sample alignment stage
- measurement camera
- optical microscope with video camera capacity to enable observation of the sample image on the computer monitor
- x-ray tube complete with power supply
- x-ray-optical lens with focal spot size within the range of 50 to 250 micron
- lens alignment assembly
- semiconductor detector
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Principle operation of microfocus x-ray spectrometer "Focus-2" : by moving the stage, the target area on the sample placed in the measurement chamber for element composition study is identified. The location of X-ray probe matches the crosshair of the optical microscope enabling control of the target point. Two laser beams are also aimed at the same point to provide for height adjustment of the sample. When those beams match the microscope’s cross, the target point is aligned for x-ray exposure.
The microfocus x-ray spectrometer "Focus-2" is easy to operate, features full computer control, no special qualified servicing personnel is required to run it.
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Microfocus X-ray Fluorescence Spectrometer "Focus-2"on the basis of Kumakhov polycapillary optics has a wide range of application, such as:
Ferrous and non-ferrous metallurgy,geology, mining, ecology, jewelry, forensic sciences, customs inspection, chemical industry, pharmacology and pharmaceutics, human-related investigations, and many more...
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The Microfocus X-ray Fluorescence Spectrometer "Focus-2" is certified ( Pattern Approval Certificate of Measuring Instruments RU.C.31.002.A N 6322 ), and has been highly appraised at a major international trade show “Kuzbass Fair”.
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Spectrum of Telluride in gold
Tungsten ore
Pentlandite spectrum
Banknote, different points
Spectrum of human hair
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SPECIFICATIONS OF X-RAY SPECTROMETER "FOCUS-2"
Chamber for samples
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Sample size
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from 20 micron to 50õ50 õ30 mm
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Sample type
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solids, powders, liquids, films
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Measurement environment
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air
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Movement control
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manual
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Movement step along Õ and Y
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18 mm
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Movement step along Z
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8 mm
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Identification of the position of x-ray on the sample
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optical and with lasers
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Detector
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Detector type
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Si-PIN diode
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Cooling
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Peltier element
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Energy resolution for 5.9 KeV line
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186-200 eV
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Load on the detector without resolution losses
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5000
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X-ray Source & Power supply
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X-ray source
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OXFORD x-ray tube
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Anode
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Ìo
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Optional
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Rh
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Filter application capability
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YES
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High voltage
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50 kV
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Current
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1.0 mA
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Cooling
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air
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X-ray tube control modes
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computer-assisted and manual
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Microscope
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Optical magnification range
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15-60 times
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Digital camera capability
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YES
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General
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Elemental Analysis
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Qualitative and Quantitative
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Range of Identified Elements
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from P to U
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Range of measurement
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from 30 ppm to 100%
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Maximum sensitivity
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10 ppm
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Number of concurrently identified elements
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up to 20
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Time of analysis
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60 to 600 sec
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Sample illumination
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20 W halogen lamp
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Design
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Analyzer Unit
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450x230x450 mm
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Power Supply Unit
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340x320x130 mm
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Make
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desktop instrument
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Computer
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IBM-compatible Pentium III and better
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Operating Conditions
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temperature 5 to 30° Ñrelative humidity 20 to 80 %
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